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Published online before print January 24, 2008, 10.1101/gr.7073008
Genome Res. 18:469-476, 2008
©2008 by Cold Spring Harbor Laboratory Press; ISSN 1088-9051/08 $5.00
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Methods

Genome-wide, high-resolution DNA methylation profiling using bisulfite-mediated cytosine conversion

Jon Reinders1,3, Céline Delucinge Vivier2, Grégory Theiler1, Didier Chollet2, Patrick Descombes2, and Jerzy Paszkowski1

1 Laboratory of Plant Genetics, Department of Plant Biology, University of Geneva, CH-1211 Geneva 4, Switzerland; 2 Genomics Platform, National Center of Competence in Research Frontiers in Genetics, University of Geneva/CMU, CH-1211 Geneva 4, Switzerland

Methylation of cytosines (mC) is essential for epigenetic gene regulation in plants and mammals. Aberrant mC patterns are associated with heritable developmental abnormalities in plants and with cancer in mammals. We have developed a genome-wide DNA methylation profiling technology employing a novel amplification step for DNA subjected to bisulfite-mediated cytosine conversion. The methylation patterns detected are not only consistent with previous results obtained with mC immunoprecipitation (mCIP) techniques, but also demonstrated improved resolution and sensitivity. The technology, named BiMP (for Bisulfite Methylation Profiling), is more cost-effective than mCIP and requires as little as 100 ng of Arabidopsis DNA.

3 Corresponding author.

E-mail jon.reinders{at}bioveg.unige.ch; fax 41-22-379-3107.

[Supplemental material is available online at www.genome.org. The sequence data from this study have been submitted to the Gene Expression Omnibus (GEO) at NCBI under accession no. GSE9051.]

Article published online before print. Article and publication date are at http://www.genome.org/cgi/doi/10.1101/gr.7073008


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